CRAIC Technologies offers the QDI 2010 PV microspectrophotometer. The QDI 2010 PV instrument is designed to measure the transmission and reflectance of photovoltaic cells whether they be the traditional crystalline silicon, one of the thin film variety, or such components as super- and substrates. The QDI 2010 PV also enables the user to determine thin film thickness of microscopic sampling areas on both transparent and opaque substrates. CRAIC Technologies, 310-573-8180, www.microspectra.com